APEC Inspection Service has added positive material identification via LIBS analyzer to its list of testing services.

Laser Induced Breakdown Spectroscopy (LIBS) is a powerful, nondestructive technique for measuring elemental composition of metals including carbon content of Fe and SS alloys as well as PMI of Ni, Ti, Cu, Co and Al alloys.

Handheld LIBS analyzers are portable devices that can be used on location for immediate, lab-quality results to help you determine the next course of action and where it’s needed in your business.

Applications:

Determine alloy composition and grade for a wide range of metallurgical samples.

Calculate carbon equivalency to determine piping weldability.

Verify critical assets, such as, piping, valves, and reaction vessels for Positive Material Identification (PMI)

Inspect materials at receiving, in-process fabrication and outgoing Quality Control (QC)

Validate Material Test Reports (MTR)

Prevent contaminated scrap from entering the supply stream.

Detect tramp and trace elements to meet regulatory standard.

Non-destructive analysis and accurate grade identification for manufacturing quality control and assurance.

Hand held XRF’s are great for the analysis of light elements (Mg to S) for fast testing of most commercial alloys, including aluminum alloys, Si and AI bronzes. It provides low limits of detection for accurate grade separation (e.g. 303-304, 6061-6063) with laboratory quality results in seconds.

Analysis of welds and welding materials

Verify that the alloys to be welded together are of the specified grade and chemistry. Avoid mix-ups and check the appropriate filler material is used. Confirm the weld meets specification during final acceptance tests. Verify in-service welds during positive material identification (PMI) inspection programs.

Non-destructive analysis of electroless nickel coatings on steel

Handheld X-ray fluorescence (XRF) analyser providing fast, accurate and non-destructive determination of NiP coating composition and thickness on steel. The combination of a high performance 50kV X-ray tube and Hitachi High-Tech’s high-resolution silicon-drift detector (SDD) provides faster analysis and lower limits of detection.

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